Keysight Technologies has launched the third generation of its P9000 series massively parallel parametric test system. The system accelerates the fast ramp of new technology and reduces the cost-of-test in the development and manufacturing of advanced semiconductor logic and memory integrated circuits.
With the new per-pin parametric test module of the third generation of the P9000, the Keysight P9015A tester has further shortened the time of capacitance measurements to address the trend of increasing test volumes of capacitance due to multilayer interconnection and new device structure. The new module enables the measurement of leaky capacitance by using its enhanced direct charge measurement technology and enables more than two times faster single capacitance measurement with good data correlation for various types of capacitance when compared to conventional LCR meters. In addition, the 100-pin parallel capability of capacitance measurement allows customers to achieve further throughput improvement.
